A platform for time-resolved scanning Kerr microscopy in the near-field
نویسندگان
چکیده
منابع مشابه
Time-resolved second harmonic generation near-field scanning optical microscopy.
Novel scanning probe microscopy (SPM) spectroscopic techniques are currently receiving much attention. The increasing number of spectroscopic techniques, when combined with the high spatial resolution that is attainable with SPM, makes it possible to probe a large range of material characteristics on the nanoscopic scale. The ability to probe samples on the nanoscale with femtosecond time resol...
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We demonstrate the ability of near-field scanning optical microscopy (NSOM) technique to detect inhomogeneities of the dynamics of excess carriers in oxidized silicon wafers. NSOM is used to improve the spatial resolution of a standard IR-scattering optical technique, which is carried out in a non contact fashion. Continuous wave infrared light is used as a detector of the time dependent carrie...
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Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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Date The final copy of this thesis has been examined by the signatories, and we find that both the content and the form meet acceptable presentation standards of scholarly work in the above mentioned discipline. Thesis directed by Professor Markus Raschke Scattering scanning near-field optical microscopy (s-SNOM) is a powerful technique for measuring spectroscopic properties of materials with s...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2017
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.4998016